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State of Small Amount of Elements in Silicon Nitride Fabricated by Post-Sintering Process Using Low-Grade Silicon Powder as Raw Materials

机译:以低品位硅粉为原料的后烧结工艺氮化硅中微量元素的状态

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摘要

The state of small amount of elements containing impurity in silicon nitride produced by the post sintering method from low-grade silicon powder was investigated. Iron reacted with other components in the raw materials in the sintering process to form iron silicide particles which were subsequently distributed. Most particles were as large as 2 mu m in diameter. Linear voids that were considered to originate in the difference of thermal expansion coefficients were observed in their perimeter. Ta_O_5 also reacted with other elements and it was observed in the form of tantalum silicide particles. The size was few hundreds nanometer. Calcium was detected from mul-tigrain pockets. However, not a particnlar particle segregation could be observed. For this reason, it is presumed that Calcium was solved into the grain-boundary phase.
机译:研究了通过后烧结法由低品位硅粉生产的氮化硅中含有少量杂质的元素的状态。铁在烧结过程中与原料中的其他成分反应形成硅化铁颗粒,随后将其分布。大多数颗粒的直径最大为2微米。在其周边观察到被认为是由于热膨胀系数不同而引起的线性空隙。 Ta_O_5也与其他元素反应,并且以硅化钽颗粒的形式观察到。尺寸为几百纳米。从多个小花袋中检测到钙。但是,未观察到特定的颗粒偏析。因此,推测将钙溶解为晶界相。

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