首页> 外文期刊>日本セラミックス協会学術論文誌 >Highly textured Na_xCoO_(2-delta) ceramics fabricated by both templated grain growth and reactive templated grain growth methods using single-crystalline particles as templates
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Highly textured Na_xCoO_(2-delta) ceramics fabricated by both templated grain growth and reactive templated grain growth methods using single-crystalline particles as templates

机译:使用单晶颗粒作为模板通过模板化晶粒生长和反应性模板化晶粒生长方法制造的高织构化Na_xCoO_(2-δ)陶瓷

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摘要

Textured gamma-Na_xCoO_(2-delta) ceramics have been prepared by both templated grain growth (TGG) and reactive templated grain grwoth (RTGG) methods using single-crystalline particles of gamma-Na_xCoO_(2-delta) as templates. An XRD analysis indicated that the samples were highly c-axis oriented; i.e.,the highest Lotgering's factor was estimated to be 0.93. According to transport property measurements,the highly textured gamma-Na_xCoO_(2-delta) sample exhibited electrical conductivity (delta)=approx1.85*10~4 S/m,Seebeck coefficient (S)=approx137 muV/K and power factor (PFident todelta·S~2)=0.35 mW·m~(-1)·K~(-2) at approx800 K. These values of delta and S are smaller than those of single crystals (sc); that is,delta_(sc)=19.2*10~4 S/m and S_sc=200 muV/K at 800 K. The magnitude of delta was found to decrease inproportion to the relative density (d) of the sample,while S was independentof d. Furthermore,both delta and S seemed to be sensitive to the Na content of the samples. Both the low density (dapprox70%) and the deviation from the optimal Na content were considered to be predominant factors for the low thermoelectric properties of the present textured samples.
机译:通过使用γ-Na_xCoO_(2-δ)的单晶颗粒作为模板,通过模板化晶粒生长(TGG)和反应性模板化晶粒长大(RTGG)方法,已经制备了纹理化的γ-Na_xCoO_(2-δ)陶瓷。 X射线衍射分析表明样品是高度c轴取向的。即,最高的Lotgering系数估计为0.93。根据传输性能的测量,高织构化的γ-Na_xCoO_(2-delta)样品的电导率(delta)=约1.85 * 10〜4 S / m,塞贝克系数(S)=约137μV/ K,功率因数( PFident todelta·S〜2)= 0.35 mW·m〜(-1)·K〜(-2),大约在800 K时。Δ和S的值比单晶(sc)小。即在800 K时delta_(sc)= 19.2 * 10〜4 S / m和S_sc = 200 muV / K。发现δ的大小与样品的相对密度(d)成比例降低,而S为独立于d。此外,δ和S似乎都对样品中的Na含量敏感。低密度(大约70%)和与最佳Na含量的偏差都被认为是导致本发明织构样品的低热电性能的主要因素。

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