X-RAY PHOTOELECTRON SPECTROSCOPIC (XPS) STUDIES OF CLEAN AND ION BEAM BOMBARDED SB2TE2SE AND (BI0.7SB0.3)(2)SE-3.0 (111) SURFACES

摘要

The first detailed study of photoelectron spectra of Sb2Te2Se and (Bi0.7Sb0.3)(2)Se-3 (111) clean and sputtered surfaces is presented as part of an XPS examination of the surface chemistry of these and related materials. The core level binding energies and surface chemical composition have been determined from the XPS data. On substitution of Te by Se in Sb2Te3 leading to Sb2Te2Se the core level binding energies in Sb and Te increase by 0.3 eV while in Bi2Se3 the binding energy of core electrons does not change on replacement of Bi by Sb. The measured core level shifts are caused by changes of the initial state charge distribution and result in increase of average ionicity of bonding in the Sb2Te2Se crystal. The surface composition of Sb2Te2Se sample calculated from intensities of photoelectron spectra agrees well with the bulk composition of the crystal while (Bi0.7Sb0.3)(2)Se-3 sample shows enrichment in Bi. The effect of argon ion bombardment on surface composition for various impact conditions has been investigated. The surface enrichment in Sb and Bi for Sb2Te2Se and (Bi0.7Sb0.3))(2)Se-3 sample due to different atomic sputtering yields is observed. It follows from the relative intensities of photoelectron spectra measured at different detection angles that the ordered arrangement of the superficial layers sampled by the XPS method is damaged by sputtering at ion energies as low as 200 eV and doses I > 2. 10(15) ion/cm(2). [References: 24]