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首页> 外文期刊>Journal of X-ray science and technology >Measurement of real and imaginary form factors of silver atom using a high resolution HPGe detector
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Measurement of real and imaginary form factors of silver atom using a high resolution HPGe detector

机译:使用高分辨率HPGe检测器测量银原子的实部和虚部形状因子

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The real and imaginary form factors of silver atom have been determined by using EDXRF method. The K x-ray photons in the energy range from 8.62 keV to 52.18 keV are generated by sending 59.56 keV gamma photons from ^{241}Am radioactive source on various targets. These K x-ray photons are transmitted through silver foils of suitable thickness. The incident and transmitted K x-ray photon intensities have been measured with a high resolution HPGe detector which is coupled to 16K MCA. The photoelectric cross sections at different K x-ray energies have been determined by measuring the intensities of the incident and transmitted x-ray photons. From these photoelectric cross section values, the imaginary form factors and the real form factors have been determined at various photon energies. Measured imaginary and real form factor values have been compared with theoretical values predicted by XCOM [23] and FFAST [24].
机译:使用EDXRF方法已经确定了银原子的实形和虚构形状因子。通过从^ {241} Am放射源向各种目标发送59.56 keVγ光子来生成能量范围为8.62 keV至52.18 keV的K x射线光子。这些K X射线光子通过合适厚度的银箔传输。已使用高分辨率HPGe检测器测量了入射和透射的K x射线光子强度,该检测器与16K MCA耦合。通过测量入射和透射X射线光子的强度,可以确定在不同K射线能量下的光电截面。从这些光电横截面值,已经确定了在各种光子能量下的虚数形状因子和实数形状因子。已将实测的虚实系数值与XCOM [23]和FFAST [24]预测的理论值进行了比较。

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