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Determination of K shell parameters of silver using high resolution HPGe detector spectrometer

机译:使用高分辨率HPGe检测器光谱仪测定银的K壳参数

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The K shell parameters such as K shell photoelectric cross-section at K shell binding energy, K shell jump ratio, K shell jump factor, the Davisson-Kirchner ratio and K. shell oscillator strength of silver have been determined using high resolution HPGe detector coupled to 16K multichannel analyser. In this method the K X-ray photons in the energy region from 8 to 52 keV are generated by sending 59.56 keV gamma photons from Am-241 source on various targets. These X-ray photons are allowed to pass through a silver foil in good geometry arrangement. By measuring the intensities of incident and transmitted photons, the mass attenuation coefficients are determined at various X-ray energies. Measured mass attenuation coefficient around K shell binding energy and K shell parameters have been compared with values predicted by XCOM and FFAST and with other experimental values.
机译:已使用高分辨率HPGe检测器测定了银的K壳参数,例如K壳结合能,K壳跳跃比,K壳跳跃因子,Davisson-Kirchner比和K.到16K多通道分析仪。在这种方法中,通过从Am-241源向各种目标发送59.56 keV伽马光子来生成8到52 keV能量范围内的K X射线光子。允许这些X射线光子以良好的几何结构穿过银箔。通过测量入射和透射光子的强度,可以在各种X射线能量下确定质量衰减系数。已将围绕K壳结合能和K壳参数测得的质量衰减系数与XCOM和FFAST预测的值以及其他实验值进行了比较。

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