首页> 外文期刊>Journal of X-ray science and technology >A model-based correction method for beam hardening artefacts in X-ray microtomography
【24h】

A model-based correction method for beam hardening artefacts in X-ray microtomography

机译:基于模型的X射线显微断层扫描中束硬化伪像的校正方法

获取原文
获取原文并翻译 | 示例
       

摘要

In micro computer tomography (μCT) and medical CT, X-ray sources are polychromatic. Because of this polychromaticity, Beer's law, which states that the ratio of the attenuated and incoming X-ray beam is exponential with the thickness of the material, is no longer valid. This leads to quantitative and visual errors in the reconstructed images, e.g. cupping and streak artefacts. This paper describes a correction scheme for these artefacts using a bimodal energy model for the source-detector energy spectrum. In essence, this correction procedure is a linearization technique based on a physical model. Results are obtained for different test objects made of combinations of plexiglas, bone, water, and aluminium. They demonstrate the effectiveness of the bimodal model correcting for the beam hardening artefact in two-, and multi-component systems.
机译:在微型计算机断层扫描(μCT)和医学CT中,X射线源是多色的。由于这种多色性,比尔定律不再有效,该定律指出衰减的X射线束与入射的X射线束之比与材料的厚度成指数关系。这导致重建图像中的定量和视觉误差,例如拔罐和条纹假象。本文针对源探测器能量谱使用双峰能量模型描述了这些伪影的校正方案。本质上,此校正过程是基于物理模型的线性化技术。对于由有机玻璃,骨头,水和铝制成的不同测试对象,可以获得结果。他们证明了双峰模型校正在两个和多个组件系统中的束硬化伪影的有效性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号