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Study of self-diffusion in silicon at high pressure

机译:高压下硅中自扩散的研究

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摘要

The process of self-diffusion in semiconductors at high pressure is studied using the statistical moment method including the anharmonicity effects of the lattice vibration. The activation energy, Q, and pre-exponential factor, D-0, of the self-diffusion coefficient are given in an explicit form. The thermodynamic relationships so obtained permit the direct calculation of the activation energy, Q, and pre-exponential factor, D-0. in Si at high pressure, both in the high temperature region near the melting temperature, and at low (room temperature) temperatures. The calculated results are shown to be in good agreement with the experimental data.
机译:使用统计矩量法研究了半导体在高压下的自扩散过程,其中包括晶格振动的非谐效应。自扩散系数的激活能Q和指数前因子D-0以明确的形式给出。如此获得的热力学关系允许直接计算活化能Q和预指数因子D-0。在高压下,无论是在接近熔化温度的高温区域,还是在低温(室温)下,Si中都具有较高的含量。计算结果与实验数据吻合良好。

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