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首页> 外文期刊>Journal of Tribology >Adhesion and Pull-Off Forces for Polysilicon MEMS Surfaces Using the Sub-Boundary Lubrication Model
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Adhesion and Pull-Off Forces for Polysilicon MEMS Surfaces Using the Sub-Boundary Lubrication Model

机译:使用次边界润滑模型的多晶硅MEMS表面的附着力和拉力

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摘要

Miniature devices including MEMS and the head disk interface in magnetic storage often include very smooth surfaces, typically having root-mean-square roughness, σ of the order of 10 nm or less. When such smooth surfaces contact, or come into proximity of each other, either in dry or wet environments, then strong intermolecular (adhesive) forces may arise. Such strong intermolecular forces may result in unacceptable and possibly catastrophic adhesion, stiction, friction and wear. In the present paper, a model termed sub-boundary lubrication (SBL) adhesion model is used to calculate the adhesion forces, and an elastic-plastic model is used to calculate the contact forces at typical MEMS interfaces. Several levels of surface roughness are investigated representing polished and as-deposited polysilicon films that are typically found in MEMS. The SBL adhesion model reveals the significance of the surface roughness on the adhesion and pull-off forces as the surfaces become smoother. The validity of using the SBL adhesion model to estimate the pull-off forces in miniature systems is further supported by direct comparison with experimental pull-off forces in miniature systems is further supported by direct comparison with experimental pull-off force measurements performed on silicon and gold interfaces. Finally, the significance of the interfacial forces as relate to the reliability of MEMS interfaces is discussed.
机译:包括MEMS和磁存储中的磁头磁盘接口在内的小型设备通常包括非常光滑的表面,通常具有均方根粗糙度,σ约为10 nm或更小。在干燥或潮湿的环境中,当这样的光滑表面接触或彼此接近时,可能会产生强大的分子间(粘合)力。如此大的分子间作用力可能会导致不可接受的粘附力,静摩擦,摩擦和磨损,并可能造成灾难性的后果。在本文中,一个名为次边界润滑(SBL)粘附模型的模型用于计算粘附力,而一个弹塑性模型用于计算典型MEMS接口处的接触力。研究了几种水平的表面粗糙度,它们代表了通常在MEMS中发现的抛光和沉积的多晶硅膜。 SBL粘附模型揭示了随着表面变得更光滑,表面粗糙度对粘附力和拉脱力的重要性。通过与在硅和硅上进行的实验拉拔力测量值直接比较,进一步支持了使用SBL粘附模型估算微型系统中拉拔力的有效性。黄金接口。最后,讨论了界面力与MEMS接口可靠性相关的意义。

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