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首页> 外文期刊>Journal of the Optical Society of America, B. Optical Physics >Bunching, antibunching, and the Poisson limit of Bose-Einstein processes at low-degeneracy parameters
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Bunching, antibunching, and the Poisson limit of Bose-Einstein processes at low-degeneracy parameters

机译:低简并性参数下Bose-Einstein过程的聚束,反聚束和泊松极限

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摘要

Random point processes are often classified as bunched, unbunched, or antibunched, depending on the value assumed by their variance-to-mean ratio (the Fano factor); in the low-degeneracy limit, the Fano factor of a Bose-Einstein process approaches the Poisson value of unity This fact probably added strength to the conjecture that in the limit of zero degeneracy a Bose-Einstein process reduces to a memoryless Poisson process. After considering some statistics related both to counting and to arrival times, we have experimentally verified that a Bose-Einstein process retains its correlation properties down to values of the degeneracy parameter of the order of 0.01. It also follows that the two most common definitions of photon bunching, the one based on the Fano factor and the one based on the correlation function, are not equivalent at low degeneracy levels. (C) 2005 Optical Society of America.
机译:随机点过程通常根据其方差与均值比(Fano因子)所假定的值分为成束,不成束或反成束。在低简并度极限中,玻色-爱因斯坦过程的Fano因子接近统一的Poisson值。这一事实可能会增强推测,即在零简并度的情况下,玻色-爱因斯坦过程减少为无记忆的泊松过程。在考虑了一些与计数和到达时间有关的统计信息之后,我们通过实验验证了Bose-Einstein过程将其相关属性保留到退化参数的值大约为0.01。还可以得出结论,在低简并度水平下,两种最常见的光子聚集定义(基于Fano因子的定义和基于相关函数的定义)不相等。 (C)2005年美国眼镜学会。

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