首页> 外文期刊>Journal of the Optical Society of America, B. Optical Physics >Continuous-wave cavity ringdown spectroscopy applied to solids: Properties of a Fabry-Perot cavity containing a transparent substrate
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Continuous-wave cavity ringdown spectroscopy applied to solids: Properties of a Fabry-Perot cavity containing a transparent substrate

机译:应用于固体的连续波腔衰荡光谱:包含透明基板的Fabry-Perot腔的性质

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摘要

Cavity ringdown spectroscopy, or photon-trap spectroscopy for generality, is shown to be applicable to a sample in the solid phase by theoretical and experimental studies. In the technique investigated, a solid in a substrate form having optically flat parallel surfaces is inserted exactly normal to a light beam in a high-finesse optical cavity; the light reflected at the substrate surface is coupled back to the cavity and thus the optical loss is minimized. Thereby the trapping lifetime of photons in the cavity is measured to obtain total optical loss including absorption by the solid sample. As the solid substrate behaves as an extra cavity splitting the original cavity, the trapped photons are susceptible to an interference effect inherent to the triply coupled cavity. To elucidate this effect, the coupling efficiency of the incident light and the trapping lifetime of photons dissipating exponentially were analyzed theoretically for a Fabry-Perot cavity containing a transparent substrate as a model. An experiment was performed on a silicon substrate transparent in the mid-infrared range with a cw optical parametric oscillator based on periodically poled lithium niobate. The optical loss caused by insertion of the substrate was measured to be 2.3 x 10(-4) per round trip, which meets a low-loss requirement of the photon-trap technique. The trapping lifetime of photons was found to depend on the location of the substrate as predicted by theory. By optimizing the experimental conditions, the present technique provides a high sensitivity to optical absorption associated with a trace amount of dopants in solids and adsorbates on surfaces. (C) 2005 Optical Society of America.
机译:通过理论和实验研究表明,腔衰荡光谱法或广义上的光子阱光谱法适用于固相样品。在所研究的技术中,将具有光学平面平行表面的基板形式的固体完全垂直于光束插入高精细光学腔中。基板表面反射的光被耦合回腔体,从而使光损耗最小。因此,测量腔中光子的俘获寿命,以获得包括固体样品吸收在内的总光学损失。由于固体基质表现为将原始腔体分开的额外腔体,因此捕获的光子容易受到三重耦合腔体固有的干扰效应的影响。为了阐明这种影响,对于包含透明基板作为模型的Fabry-Perot腔,从理论上分析了入射光的耦合效率和耗散指数的光子的俘获寿命。使用基于周期性极化铌酸锂的cw光学参量振荡器,在中红外透明的硅基板上进行了实验。经测量,由基板插入引起的光损耗为每往返2.3 x 10(-4),这满足了光子捕获技术的低损耗要求。如理论所预测的,发现光子的俘获寿命取决于衬底的位置。通过优化实验条件,本技术对与固体中的痕量掺杂剂和表面上的吸附物相关的光吸收提供了高灵敏度。 (C)2005年美国眼镜学会。

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