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首页> 外文期刊>Journal of the Korean Physical Society >High-performance black phosphorus top-gate ferroelectric transistor for nonvolatile memory applications
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High-performance black phosphorus top-gate ferroelectric transistor for nonvolatile memory applications

机译:用于非易失性存储应用的高性能黑磷顶栅铁电晶体管

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摘要

Two-dimensional (2D) van der Waals (vdW) atomic crystals have been extensively studied and significant progress has been made. The newest 2D vdW material, called black phosphorus (BP), has attracted considerable attention due to its unique physical properties, such as its being a singlecomponent material like graphene, and its having a high mobility and direct band gap. Here, we report on a high-performance BP nanosheet based ferroelectric field effect transistor (FeFET) with a poly(vinylidenefluoride-trifluoroethylene) top-gate insulator for a nonvolatile memory application. The BP FeFETs show the highest linear hole mobility of 563 cm(2)/Vs and a clear memory window of more than 15 V. For more advanced nonvolatile memory circuit applications, two different types of resistive-load and complementary ferroelectric memory inverters were implemented, which showed distinct memory on/off switching characteristics.
机译:二维(2D)范德华(vdW)原子晶体已得到广泛研究,并取得了重大进展。最新的2D vdW材料称为黑磷(BP),由于其独特的物理特性(例如像石墨烯这样的单组分材料)以及具有高迁移率和直接带隙的特性而备受关注。在这里,我们报告了一种基于BP纳米片的高性能铁电场效应晶体管(FeFET),该晶体管具有用于非易失性存储器应用的聚偏二氟乙烯-三氟乙烯顶栅绝缘子。 BP FeFET具有563 cm(2)/ Vs的最高线性空穴迁移率和超过15 V的清晰存储器窗口。对于更高级的非易失性存储器电路应用,实现了两种不同类型的电阻负载和互补铁电存储器反相器,显示出明显的内存开/关切换特性。

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