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Mechanical and thermoelectric properties of Bi2-xSbxTe3 prepared by using encapsulated melting and hot pressing

机译:包覆熔化和热压制备的Bi2-xSbxTe3的机械和热电性质

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摘要

Bi2-xSbxTe3 (x = 1.4 - 1.7) solid solutions were synthesized by using encapsulated melting (EM) and were consolidated by using hot pressing (HP). The lattice constants decreased with increasing Sb content, which indicated that solid solutions were successfully synthesized. The relative densities of all the hot-pressed specimens were higher than 97.9 %. X-ray diffraction patterns, pole figures and electron backscattered diffraction spectra of all the hot-pressed specimens indicated randomly oriented textures. Very low values of the orientation factor (F) were obtained, F-min = 0.008 for Bi0.4Sb1.6Te3 hot-pressed at 673 K and F-max = 0.115 for Bi0.4Sb1.6Te3 hot-pressed at 723 K, which implied that the microstructures were highly isotropic. A bending strength of 46 MPa and a Vickers hardness of 94 Hv were attained for Bi0.4Sb1.6Te3 hot-pressed at 648 K. However, the mechanical properties were degraded with increasing HP temperature owing to grain growth. An increased HP temperature did not affect the electrical properties significanctly. The carrier concentration increased with increasing Sb content, and the specimen with x = 1.4 showed nondegenerate semiconductor behavior whereas those with x aeyen 1.5 behaved as degenerate semiconductors. All specimens showed p-type conduction, which was confirmed from the positive signs of the Seebeck coefficient and the Hall coefficient. The increased Sb content caused a shift in the peak values of the Seebeck coefficient to higher temperatures and an enhancement of the power factor. The electronic thermal conductivity decreased, but the lattice thermal conductivity increased, with increasing Sb content. The lowest theraml conductivity of 0.83 Wm K-1 (-1) was obtained at 373 K for Bi0.4Sb1.6Te3. The maximum dimensionless figure of merit, ZT (max) = 1.1, was achieved at 323 K for Bi0.4Sb1.6Te3.
机译:Bi2-xSbxTe3(x = 1.4-1.7)固溶体通过封装熔炼(EM)合成,并通过热压(HP)固结。晶格常数随Sb含量的增加而降低,表明固溶体合成成功。所有热压试样的相对密度均高于97.9%。所有热压样品的X射线衍射图,极图和电子背散射衍射谱均显示出随机取向的织构。获得了非常低的取向因子(F)值,对于在673 K下热压的Bi0.4Sb1.6Te3,F-min = 0.008,对于在723 K下热压的Bi0.4Sb1.6Te3,F-max = 0.115暗示微观结构是高度各向同性的。在648 K下热压的Bi0.4Sb1.6Te3的弯曲强度为46 MPa,维氏硬度为94 Hv。但是,由于晶粒的生长,机械性能随着HP温度的升高而降低。 HP温度升高不会明显影响电性能。载流子浓度随Sb含量的增加而增加,x = 1.4的样品表现出未退化的半导体行为,而x aeyen 1.5的样品表现为退化的半导体。所有样品均显示出p型导电,这可以通过塞贝克系数和霍尔系数的正号来确认。 Sb含量的增加导致Seebeck系数的峰值移至更高的温度,并提高了功率因数。随着Sb含量的增加,电子热导率降低,但晶格热导率增加。对于Bi0.4Sb1.6Te3,在373 K下获得最低的芳族聚酰胺电导率0.83 Wm K-1(-1)。对于Bi0.4Sb1.6Te3,在323 K下获得了最大无量纲的品质因数ZT(max)= 1.1。

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