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Segregation of anion (Cl~- ) impurities at transparent polycrystalline α-alumina interfaces

机译:阴离子(Cl〜-)杂质在透明多晶α-氧化铝界面处的偏析

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摘要

Small amounts of anion impurities (e.g. Cl), which are incorporated during the synthesis of ceramic powders, can affect the properties and microstructurc of the final sintered ceramic. The effect of anion impurities is a little studied and poorly understood phenomenon. In this work a combination of STEM-EDX analysis and atomistic modeling approach was used to understand the segregation of Cl in transparent alumina ceramics. A high resolution analytical electron microscopy study showed the presence of Cl at the grain boundaries and especially at triple points. Atomistic simulations were carried out to understand the origins and consequences of such segregation. Segregation energy calculations predict a strong segregation of Cl at the different surfaces and grain boundaries of alumina. A higher coordination number of Cl at surfaces was observed, which indicates strong ionic bonds making it difficult to remove at low temperature, which explains the presence of Cl at triple points.
机译:在陶瓷粉末合成过程中掺入的少量阴离子杂质(例如Cl)会影响最终烧结陶瓷的性能和微观结构。阴离子杂质的影响是经过很少研究和了解的现象。在这项工作中,结合使用STEM-EDX分析和原子建模方法来了解透明氧化铝陶瓷中Cl的偏析。高分辨率分析电子显微镜研究表明,在晶界,尤其是在三点处存在Cl。进行原子模拟以了解这种分离的起源和后果。偏析能的计算预测了在氧化铝的不同表面和晶界处Cl的强烈偏析。观察到Cl在表面的配位数更高,这表明强的离子键使其难以在低温下除去,这解释了Cl在三点存在。

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