首页> 外文期刊>Journal of Semiconductors >A signal processing method for the friction-based endpoint detection system of a CMP process
【24h】

A signal processing method for the friction-based endpoint detection system of a CMP process

机译:CMP工艺中基于摩擦的终点检测系统的信号处理方法

获取原文
获取原文并翻译 | 示例
           

摘要

A signal processing method for the friction-based endpoint detection system of a chemical mechanical polishing (CMP) process is presented. The signal process method uses the wavelet threshold denoising method to reduce the noise contained in the measured original signal, extracts the Kalman filter innovation from the denoised signal as the feature signal, and judges the CMP endpoint based on the feature of the Kalman filter innovation sequence during the CMP process. Applying the signal processing method, the endpoint detection experiments of the Cu CMP process were carried out. The results show that the signal processing method can judge the endpoint of the Cu CMP process.
机译:提出了一种基于摩擦的化学机械抛光(CMP)工艺终点检测系统的信号处理方法。信号处理方法使用小波阈值去噪方法来减少所测量的原始信号中包含的噪声,从去噪后的信号中提取卡尔曼滤波器创新作为特征信号,并根据卡尔曼滤波器创新序列的特征判断CMP端点在CMP过程中。应用信号处理方法,进行了Cu CMP工艺的终点检测实验。结果表明,该信号处理方法可以判断Cu CMP工艺的终点。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号