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Low dielectric constant silica films prepared by a templating method

机译:通过模板法制备的低介电常数二氧化硅膜

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The preparation of low dielectric constant porous silica films by a templating method was studied in this research. Several organic compounds (including ionic and nonionic surfactants), which can be dissolved in the coating solution, were used as the template. They were applied to make pores in the film by burning them off during calcination in the air. TEOS (tetraethyl orthosilicate) was used as the silica source for the preparation of sol-gel. The processes that influenced the film thickness and the film surface modification were investigated. It was found from this research that the concentration of TEOS in the coating solution affected the film thickness the most. The spin speed during spin coating and the temperature increasing rate during the calcination process only slightly influenced the thickness. The surface modification was most successful when the film was immersed in the HMDS (1,1,1,3,3,3-hexamethyl disilazane) and toluene solution at 80degreesC. Moreover, for the templates tested in this research, it was found that the film using Tween 80 (polyoxyethylene(20) sorbitan monooleatel, a non-ionic surfactant) exhibited the lowest dielectric constant. [References: 11]
机译:研究了用模板法制备低介电常数的多孔二氧化硅薄膜的方法。可以溶解在涂料溶液中的几种有机化合物(包括离子和非离子表面活性剂)用作模板。通过在空气中煅烧过程中将它们燃烧掉,将它们涂在膜上以形成孔。 TEOS(原硅酸四乙酯)用作制备溶胶凝胶的二氧化硅源。研究了影响膜厚和膜表面改性的过程。从该研究中发现,涂覆溶液中TEOS的浓度对膜厚度的影响最大。旋涂过程中的旋转速度和煅烧过程中的升温速率仅对厚度产生轻微影响。当将膜浸入HMDS(1,1,1,3,3,3-六甲基二硅氮烷)和80℃的甲苯溶液中时,表面改性最成功。此外,对于本研究中测试的模板,发现使用Tween 80(聚氧乙烯(20)脱水山梨糖醇单油酸酯,一种非离子表面活性剂)的薄膜表现出最低的介电常数。 [参考:11]

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