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Experimental Study of CMC Evaluation in Single and Mixed Surfactant Systems, Using the UV-Vis Spectroscopic Method

机译:UV-Vis光谱法在单一和混合表面活性剂体系中CMC评估的实验研究

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摘要

In this study, the critical miceilar concentration (CMC) of anionic, cationic and nonionic surfactants was determined using the UV-Vis spectroscopic method. Sodium lauryl sulfate (SDS) as anionic, hexadecyl-tri-methyl-ammonium bromide as cationic, tert-octylphenol ethoxylates TOPEON (with N = 9.5, 7.5 and 35) and lauryl alcohol ethoxylate (23EO) as nonionic surfactants have been used. Concentration of surfactants varies both from below and above the CMC value in the pyrene solution. In addition, the amount of the CMC was determined using the values from the data obtained from the graph of absorbance versus concentration of surfactants. A comparative study was conducted between the results of the present study and the literature which shows a good agreement, in particular for TOPE09.5 and LAE023. Furthermore, the CMC value of SDS (as an ionic surfactant) in the presence of nonionic surfactants was also examined. The result reveals that with addition of small amount of nonionic surfactant to the anionic SDS surfactant, a decline in the CMC value of the anionic-nonionic system relative to the CMC of pure anionic surfactant was observed. In addition and for the first time, the effect of UV irradiation on the size of the micelle formations was studied. It was found that UV irradiation causes the formation of smaller micelles which is of prime concern in membrane technology.
机译:在这项研究中,使用UV-Vis光谱法确定了阴离子,阳离子和非离子表面活性剂的临界胶束浓度(CMC)。已使用十二烷基硫酸钠(SDS)作为阴离子,十六烷基三甲基溴化铵作为阳离子,叔辛基酚乙氧基化物TOPEON(N = 9.5、7.5和35)和月桂醇乙氧基化物(23EO)作为非离子表面活性剂。在s溶液中,表面活性剂的浓度从CMC值的上下变化。另外,使用从吸光度对表面活性剂浓度的曲线图获得的数据中的值确定CMC的量。在本研究结果和文献之间进行了比较研究,显示出很好的一致性,特别是对于TOPE09.5和LAE023。此外,还检查了在非离子表面活性剂存在下SDS(作为离子表面活性剂)的CMC值。结果表明,在阴离子SDS表面活性剂中添加少量非离子表面活性剂后,观察到阴离子-非离子体系的CMC值相对于纯阴离子表面活性剂的CMC下降。另外,也是第一次,研究了紫外线辐射对胶束形成物尺寸的影响。发现紫外线辐射导致形成较小的胶束,这是膜技术中最主要的问题。

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