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首页> 外文期刊>Journal of Solid State Chemistry >Effect of p-d hybridization, structural distortion and cation electronegativity on electronic properties of ZnSnX_2 (X=P, As, Sb) chalcopyrite semiconductors
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Effect of p-d hybridization, structural distortion and cation electronegativity on electronic properties of ZnSnX_2 (X=P, As, Sb) chalcopyrite semiconductors

机译:p-d杂化,结构变形和阳离子电负性对ZnSnX_2(X = P,As,Sb)黄铜矿半导体电子性能的影响

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摘要

Significant effects of p-d hybridization, structural distortion and cation-electro-negativity are found on band gap in ZnSnX_2 (X=P, As, Sb). Our study suggests these compounds to be direct band gap semiconductors with band gaps of 1.23, 0.68 and 0.19 eV respectively. Lattice constants, tetragonal distortion (η), anion displacement, bond lengths and bulk moduli are calculated by Density Functional Theory based on Tight binding Linear Muffin-Tin orbital method. Our result of structural properties is in good agreement with the available experimental and other theoretical results. Calculated band gaps also agree well with the experimental works within LDA limitation. Unlike other semiconductors in the group II-IV-V_2, there is a reduction in the band gap of 0.22, 0.20 and 0.24 eV respectively in ZnSnX_2 (X=P, As, Sb) due to p-d hybridization. Structural distortion decreases band gap by 0.20, 0.12 and 0.10 eV respectively. We find that cation electronegativity effect is responsible for increasing the band gap relative to their binary analogs ~(GaInP2), ~(InGaAs2) and ~(GaInSb2) respectively and increment are 0.13, 0.04 and 0.13 eV respectively.
机译:在ZnSnX_2(X = P,As,Sb)的带隙中发现了p-d杂交,结构变形和阳离子电负性的重要影响。我们的研究表明,这些化合物是带隙分别为1.23、0.68和0.19 eV的直接带隙半导体。基于紧密结合线性松饼-锡轨道方法,通过密度泛函理论计算出晶格常数,四方畸变(η),阴离子位移,键长和体模量。我们的结构性能结果与可用的实验和其他理论结果高度吻合。计算的带隙也与LDA限制内的实验工作非常吻合。与II-IV-V_2族中的其他半导体不同,由于p-d杂交,ZnSnX_2(X = P,As,Sb)的带隙分别减小了0.22、0.20和0.24eV。结构畸变分别将带隙减小了0.20、0.12和0.10 eV。我们发现,相对于它们的二元类似物〜(GaInP2),〜(InGaAs2)和〜(GaInSb2),阳离子电负性效应负责增加带隙,增量分别为0.13、0.04和0.13 eV。

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