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Comparative Study for Displacement Detection of Micro-Device

机译:微型设备位移检测的比较研究

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摘要

Technique of displacement testing is the important support for MEMS from study stage to industry stage. Three Micro-device displacement testing techniques are discussed: testing technique based on blur image synthesis, testing technique based on block matching, testing technique based on optical flow. Merits, demerits and scope of application for every method are analyzed. As resonator testing target, corresponding testing results are obtained. These three testing techniques are verified by experiments. Experimental results indicate that principle of testing technique based on blur image synthesis is simpler and lower requirement to hardware system. But the precision is lower. Testing technique based on block matching and technique based on optical flow have special requirement to hardware system. But they have higher precision. Testing technique based on block matching fits to test object with in-plane movement. Testing technique based on optical flow fits to test object with out of plane movement.
机译:从研究阶段到工业阶段,位移测试技术是MEMS的重要支持。讨论了三种微器件位移测试技术:基于模糊图像合成的测试技术,基于块匹配的测试技术,基于光流的测试技术。分析了每种方法的优缺点,适用范围。作为谐振器测试目标,可获得相应的测试结果。通过实验验证了这三种测试技术。实验结果表明,基于模糊图像合成的测试技术原理较为简单,对硬件系统的要求较低。但是精度较低。基于块匹配的测试技术和基于光流的技术对硬件系统有特殊要求。但是它们具有更高的精度。基于块匹配的测试技术适合平面内运动的物体的测试。基于光流的测试技术适合测试平面外的物体。

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