Local structure studies of Ni doped ZnO/PVDF composite free-standing flexible thin films using XPS and EXAFS studies

摘要

Free-standing flexible films of Ni-ZnO/PVDF with three Ni concentrations were obtained by sol-gel technique. The as-deposited and the poled composite Ni-ZnO/PVDF films contained three different amount of Ni doping in ZnO nanocrystals as Zn1-xNixO (x = 0.01, 0.04, and 0.09). XANES, XPS measurements have been carried out to investigate the valence states of the host and dopant ions in samples while local environments surrounding Zn and Ni sites have been critically examined using extended EXAFS and XPS measurements to throw a clear insight on the bonding environment in the Ni-ZnO/PVDF films