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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Hysteresis behaviour of low-voltage organic field-effect transistors employing high dielectric constant polymer gate dielectrics
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Hysteresis behaviour of low-voltage organic field-effect transistors employing high dielectric constant polymer gate dielectrics

机译:采用高介电常数聚合物栅极电介质的低压有机场效应晶体管的磁滞行为

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摘要

Here, we report on the fabrication of low-voltage-operating pentacene-based organic field-effect transistors (OFETs) that utilize crosslinked cyanoethylated poly(vinyl alcohol) (CR-V) gate dielectrics. The crosslinked CR-V-based OFET could be operated successfully at low voltages (below 4 V), but abnormal behaviour during device operation, such as uncertainty in the field-effect mobility (μ) and hysteresis, was induced by the slow polarization of moieties embedded in the gate dielectric (e.g. polar functionalities, ionic impurities, water and solvent molecules). In an effort to improve the stability of OFET operation, we measured the dependence of μ and hysteresis on dielectric thickness, CR-V crosslinking conditions and sweep rate of the gate bias. The influence of the CR-V surface properties on μ, hysteresis, and the structural and morphological features of the pentacene layer grown on the gate dielectric was characterized and compared with the properties of pentacene grown on a polystyrene surface.
机译:在这里,我们报告使用交联的氰基乙基化聚(乙烯醇)(CR-V)栅极电介质的低电压并五苯基有机场效应晶体管(OFET)的制造。交联的基于CR-V的OFET可以在低电压(低于4 V)下成功运行,但由于器件的缓慢极化导致了器件运行期间的异常行为,例如场效应迁移率(μ)和磁滞的不确定性。嵌入栅极电介质中的部分(例如极性功能,离子杂质,水和溶剂分子)。为了提高OFET操作的稳定性,我们测量了μ和磁滞对介电层厚度,CR-V交联条件和栅极偏置扫描速率的依赖性。表征了CR-V表面特性对在栅电介质上生长的并五苯层的μ,磁滞以及结构和形态特征的影响,并将其与在聚苯乙烯表面上并五苯的性能进行了比较。

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