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Thermal growth and cathodoluminescence of Bi doped ZnO nanowires and rods

机译:Bi掺杂ZnO纳米线和棒的热生长和阴极发光

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Bi doped ZnO nanowires and rods have been grown by a catalyst free evaporation–deposition method with precursors containing either ZnO and Bi2O3 or ZnS and Bi2O3 powders. The use of ZnS as a precursor was found to lead to a higher density of nano- and microstructures at lower temperatures than by using ZnO. Energy dispersive x-ray spectroscopy (EDS) shows that the Bi content in the wires and rods is in the range 0.15–0.35 at%. Bi incorporation was found to induce a red shift of the near band gap luminescence but no quantitative correlation between the shift and the amount of Bi, as measured by EDS, was observed. The I–V curves of single Bi doped wires had linear behaviour at low current and non-linear behaviour for high currents, qualitatively similar to that of undoped wires.
机译:Bi掺杂的ZnO纳米线和棒已经通过无催化剂蒸发沉积法生长,其中含有ZnO和Bi2O3或ZnS和Bi2O3粉末。与使用ZnO相比,发现在较低的温度下使用ZnS作为前体可导致更高的纳米结构和微观结构密度。能量色散X射线光谱(EDS)表明,线材和棒材中的Bi含量在0.15–0.35 at%的范围内。发现Bi掺入引起近带隙发光的红移,但是如通过EDS所测量的,未观察到该移位与Bi的量之间存在定量相关性。单根Bi掺杂导线的I–V曲线在低电流下具有线性行为,而在高电流下具有非线性行为,在质量上类似于未掺杂的导线。

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