Dispersion of resonant Raman peaks of CO and OH in SnO2, Mo1-xFexO2 thin films and SiO2 bulk glass

摘要

Resonance Raman (RR) peaks of CO and OH stretching modes and their higher harmonics have been observed superimposed on the photoluminescence (PL) spectrum of SnO2 thin films. Commercial fluorine doped SnO2 thin films deposited by sputtering on glass and SnO2 thin films deposited on Si by laser ablation have been studied. The dispersions of CO and OH stretching RR modes are similar to 600 cm(-1) eV(-1) and 800 cm(-1) eV(-1), respectively. The dispersion of the third harmonic of the CO stretching mode is similar to 2000 cm(-1) eV(-1). Similar dispersion of the RR peak of CO stretching modes and higher harmonics superimposed on PL spectra has been observed in Mo1-xFexO2 thin films and SiO2 bulk glass. Large dispersion of RR peaks seems to be a common property of oxides with impurities of CO and OH.