...
首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Analysing the thermal-annealing-induced photoluminescence blueshifts for GaInNAs/GaAs quantum wells: a genetic algorithm based approach
【24h】

Analysing the thermal-annealing-induced photoluminescence blueshifts for GaInNAs/GaAs quantum wells: a genetic algorithm based approach

机译:分析GaInNAs / GaAs量子阱的热退火引起的光致发光蓝移:一种基于遗传算法的方法

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

In this paper, we discuss two blueshift mechanisms that are present during the rapid thermal annealing of GaInNAs quantum wells (QWs). A GaInNAs/GaAs sample was grown using molecular beam epitaxy with a GaAs cap layer. Photoluminescence (PL) peak wavelengths from the QWs were measured for annealing temperatures, 680-800 degrees C, and annealing time up to 3 h. An experimental PL blueshift has been analysed for individual blueshift components due to the reorganization of the N-bonding configuration and the In/Ga interdiffusion across the QW interfaces, using a genetic algorithm based approach. It is found that the interdiffusion-induced blueshift is unaffected by the nitrogen-bonding configuration if the diffusion length is less than 2 nm. However, for larger diffusion lengths, the QW with gallium-rich N-bonding configuration shows a larger blueshift. Our calculations suggest the presence of N-Ga3In1 bonding configuration in the as-grown GaInNAs/GaAs QW, which changes to a mixture of N-Ga3In1 and N-Ga2In2 after annealing. The activation energy for short range order (SRO) is 2.38 eV, which is smaller than that for the interdiffusion process (3.196 eV), indicating that SRO is the dominant mechanism for the PL blueshift at low annealing temperatures and at the beginning of the annealing process.
机译:在本文中,我们讨论了GaInNAs量子阱(QW)快速热退火过程中存在的两种蓝移机制。使用具有GaAs盖层的分子束外延生长GaInNAs / GaAs样品。测量了来自QW的光致发光(PL)峰值波长的退火温度(680-800摄氏度)和长达3小时的退火时间。由于使用了基于遗传算法的方法,由于N键结构的重组和QW界面上In / Ga互扩散的原因,已经对单个PL蓝移成分进行了实验分析。发现如果扩散长度小于2nm,则互扩散引起的蓝移不受氮键构型的影响。但是,对于较大的扩散长度,具有富镓N键构型的QW显示出较大的蓝移。我们的计算表明,在刚生长的GaInNAs / GaAs QW中存在N-Ga3In1键合构型,退火后该构型变为N-Ga3In1和N-Ga2In2的混合物。短程有序(SRO)的活化能为2.38 eV,小于互扩散过程的活化能(3.196 eV),表明SRO是低退火温度和退火开始时PL蓝移的主要机制。处理。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号