The recollision model has been applied to separate the probability for double ionization into contributions from electron-impact ionization and electron-impact excitation for intensities at which the dielectronic interaction is important for generating double ionization. For a wavelength of 780 am, electron-impact excitation dominates just above the threshold intensity for double ionization, approximate to 1.2 x 10(14) W cm(-2), with electron-impact ionization becoming more important for higher intensities. For a wavelength of 390 nm, the ratio between electron-impact ionization and electron-impact excitation remains fairly constant for all intensities above the threshold intensity for double ionization, approximate to 6 x 10(14) W cm(-2). The results point to an explanation of the experimental results, but more detailed calculations on the behaviour of excited He+ ions are required. [References: 14]
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机译：再碰撞模型已被应用，以将双电离的概率分为来自电子碰撞电离和电子碰撞激励的强度，在这种强度下，双电子相互作用对于产生双电离很重要。对于780 am的波长，电子碰撞激发在双电离的阈值强度之上刚好占主导地位，大约为1.2 x 10（14）W cm（-2），而电子碰撞电离对于更高的强度变得更加重要。对于390 nm的波长，对于高于双电离阈值强度的所有强度，所有强度的电子冲击电离与电子冲击激励之间的比率均保持相当恒定，大约为6 x 10（14）W cm（-2）。结果指向实验结果的解释，但是需要对激发的He +离子的行为进行更详细的计算。 [参考：14]
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