FAST-ION-BEAM LASER SPECTROSCOPY OF THE B-2-SIGMA(+)-X(2)SIGMA(+) AND B-2-SIGMA(+)-A(2)PI SYSTEMS OF SIO+ - DEPERTURBATION ANALYSIS

摘要

We have completed a deperturbation analysis of a set of measurements in SiO+ including seven bands of the B-2 Sigma(+)-X(2) Sigma(+) system, the (2, 0) Omega = 1/2 sub-band of the B-2 Sigma(+)-A(2)II system, and fine structure intervals of the v = 0 level of the X(2) Sigma(+) state. The pattern of perturbations in the B-X system shows that the assignments of vibrational levels in the A(2)II state made in earlier photoelectron spectroscopy work are incorrect. Deperturbed molecular constants for the three electronic states have been derived. (C) 1995 Academic Press, Inc. [References: 14]