首页> 外文期刊>Journal of optoelectronics and advanced materials >Proton irradiation-induced defects in undoped GaSb studied by positron lifetime spectroscopy and photoluminescence
【24h】

Proton irradiation-induced defects in undoped GaSb studied by positron lifetime spectroscopy and photoluminescence

机译:通过正电子寿命谱和光致发光研究未掺杂GaSb中质子辐照引起的缺陷

获取原文
获取原文并翻译 | 示例
           

摘要

Undoped GaSb was irradiated by 2.6 MeV protons. The irradiation-induced defects were studied by positron lifetime spectroscopy (PLS) and photoluminescence (PL). Positron lifetime measurements showed that vacancy-type defects were introduced after irradiation, and divacancies were formed at higher irradiation dose. Annealing experiments revealed there were different annealing steps between the as grown and proton-irradiated samples, the reason for which was tentatively attributed to the formation of divacancies in the proton-irradiated samples during annealing. All the vacancy defects could be annealed out at around 500 °C. The PL intensity quickly fell down after proton irradiation and decreased with increasing irradiation dose, indicating that irradiation induced non-irradiative recombination centers, whose candidates were assigned to the vacancy defects induced by proton irradiation.
机译:未掺杂的GaSb被2.6 MeV质子辐照。通过正电子寿命谱(PLS)和光致发光(PL)研究了辐照引起的缺陷。正电子寿命测量表明,辐照后会引入空位型缺陷,并且在更高的辐照剂量下会形成空位。退火实验表明,生长的样品和质子辐照的样品之间存在不同的退火步骤,其原因暂时归因于在退火过程中质子辐照的样品中形成了空位。所有空位缺陷都可以在500°C左右退火。质子辐照后PL强度迅速下降,并随辐照剂量的增加而下降,表明辐照诱导了非辐照重组中心,其中心被归因于质子辐照引起的空位缺陷。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号