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Combining FIB milling and conventional Argon ion milling techniques to prepare high-quality site-specific TEM samples for quantitative EELS analysis of oxygen in molten iron

机译:结合FIB研磨和常规氩离子研磨技术以制备高质量的特定于现场的TEM样品,以进行铁水中氧气的定量EELS分析

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摘要

This paper reports a procedure to combine the focused ion beam micro-sampling method with conventional Ar-milling to prepare high-quality site-specific transmission electron microscopy cross-section samples. The advantage is to enable chemical and structural evaluations of oxygen dissolved in a molten iron sample to be made after quenching and recovery from high-pressure experiments in a laser-heated diamond anvil cell. The evaluations were performed by using electron energy-loss spectroscopy and high-resolution transmission electron microscopy. The high signal to noise ratios of electron energy-loss spectroscopy core-loss spectra from the transmission electron microscopy thin foil, re-thinned down to 40 nm in thickness by conventional Argon ion milling, provided us with oxygen quantitative analyses of the quenched molten iron phase. In addition, we could obtain lattice-fringe images using high-resolution transmission electron microscopy. The electron energy-loss spectroscopy analysis of oxygen in Fe_(0.94)O has been carried out with a relative accuracy of 2%, using an analytical procedure proposed for foils thinner than 80 nm. Oxygen K-edge energy-loss near-edge structure also allows us to identify the specific phase that results from quenching and its electronic structure by the technique of fingerprinting of the spectrum with reference spectra in the Fe-0 system.
机译:本文报道了一种将聚焦离子束微采样方法与常规Ar铣削相结合的方法,以制备高质量的特定于位置的透射电子显微镜截面样品。优点是能够在淬火和从激光加热的金刚石砧室中的高压实验中回收后,对溶解在铁水样品中的氧进行化学和结构评估。通过使用电子能量损失谱和高分辨率透射电子显微镜进行评估。来自透射电子显微镜薄箔的电子能量损失谱核心损失谱的高信噪比,通过常规的氩离子铣削重新薄至40 nm,为我们提供了淬火铁水的氧定量分析相。另外,我们可以使用高分辨率透射电子显微镜获得晶格条纹图像。 Fe_(0.94)O中的氧的电子能量损失谱分析已经使用相对于2 nm的相对精度进行了分析,使用了针对厚度小于80 nm的箔的分析程序。氧K边缘能量损失近边缘结构还使我们能够通过使用Fe-0系统中的光谱与参考光谱进行指纹识别的技术来识别淬火及其电子结构所导致的特定相。

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