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首页> 外文期刊>Journal of Microscopy >ENERGY-FILTERING TEM AND ELECTRON ENERGY-LOSS SPECTROSCOPY OF DOUBLE STRUCTURE TABULAR MICROCRYSTALS OF SILVER HALIDE EMULSIONS
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ENERGY-FILTERING TEM AND ELECTRON ENERGY-LOSS SPECTROSCOPY OF DOUBLE STRUCTURE TABULAR MICROCRYSTALS OF SILVER HALIDE EMULSIONS

机译:卤化银乳状液双结构管状微晶的能量过滤TEM和电子能谱

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摘要

Composite Ag(Br,I) tabular microcrystals of photographic emulsions were studied by the combination of energy-filtering electron microscopy (EFTEM) and electron energy-loss spectroscopy (EELS) in conjunction with energy-dispersive X-ray (EDX) microanalysis. The contrast tuning under the energy-filtering in the low-loss region was used to observe more clearly edge and random dislocations, {11(1) over bar} stacking faults in the grain shells parallel to {11(2) over bar} edges and bend and edge contours. Electron spectroscopic diffraction patterns revealed numerous extra reflections at commensurate positions in between the Bragg reflections and diffuse honeycomb contours; these were assigned to the number of defects in the shell region parallel to the grain edges and polyhedral clusters of interstitial silver cations, respectively, Inner-shell excitation bands of silver halide were detected and confirmed by EDX analyses, i.e. the Ag N-2,N-3 edge at 62 eV (probably overlapped with the weak I N-4,N-5 edge at 52 eV and the Br M(4,5) edge at 70 eV), the I M(4,5) edge at about 620 eV, and the Br L(2,3) edge at about 1550 eV energy losses. Energy-loss near-edge structure of the Ag M(4,5) edge at about 367 eV energy losses and low-loss fine structure arisen as a result of interband transitions and excitons, possibly superimposed with many electron effects, have been revealed, The crystal thickness was determined by a modified EELS log-ratio technique in satisfactory agreement with measurements on grain replicas. [References: 58]
机译:通过能量过滤电子显微镜(EFTEM)和电子能量损失谱(EELS)结合能量色散X射线(EDX)显微分析,研究了感光乳剂的复合Ag(Br,I)平板状微晶。在低损耗区域的能量过滤下进行对比度调整,可更清楚地观察到边缘和随机位错{在棒上的{11(1)}与平行在{bar}上的{11(2)}的晶粒壳中的堆积缺陷以及弯曲和边缘轮廓。电子光谱衍射图显示在布拉格反射和扩散蜂窝状轮廓之间的相应位置处有大量额外的反射。将它们分别指定为平行于间隙银阳离子的晶粒边缘和多面体簇的壳区域中的缺陷数量,通过EDX分析检测并确认了卤化银的内壳激发带,即Ag N-2, N-3边缘位于62 eV(可能与弱的I N-4,N-5边缘位于52 eV且Br M(4,5)边缘位于70 eV重叠),IM(4,5)边缘约为620 eV,并且Br L(2,3)边缘在约1550 eV的能量损失。已经发现,Ag M(4,5)边缘的能量损耗近边缘结构在约367 eV能量损耗,并且由于带间跃迁和激子(可能叠加了许多电子效应)而出现了低损耗精细结构,晶体厚度是通过改进的EELS对数比技术确定的,与晶粒复制品的测量结果令人满意。 [参考:58]

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