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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >Generation and annealing of defects in virgin fused silica (type III) upon ArF laser irradiation: Transmission measurements and kinetic model
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Generation and annealing of defects in virgin fused silica (type III) upon ArF laser irradiation: Transmission measurements and kinetic model

机译:ArF激光辐照下原始熔融石英(III型)中缺陷的产生和退火:透射率测量和动力学模型

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The transmission of ArF laser pulses in virgin fused silica (type III) samples changes during N = 10(6) pulses at an incoming fluence H-in = 5 mJ cm(-2) pulse(-1). The related absorption is determined by the pulse energy absorption coefficient alpha(N, H-in) using a modified Beer's law, yielding initial values alpha(ini) around 0.005cm(-1), a maximum alpha(max) <= 0.02 cm(-1) at N= 10(3)-10(4) and stationary values 0.0045 cm(-1) <= alpha(end) <= 0.0094 cm(-1) after N approximate to 6 x 10(5) pulses. The development alpha(N, H-in = const.) is simulated by a rate equation model assuming a pulse number dependent P center density E'(N). E'(N) is determined by a dynamic equilibrium between E' center generation and annealing. Generation occurs photolytically from the precursors ODC II and unstable SiH structures upon single photon absorption and from strained SiO bonds via two-photon excitation. Annealing in the dark periods between the laser pulses is dominated by the reaction of E' with H-2 present in the SiO2 network. The development alpha(N, H-in = const.) is observed for the very first sample irradiation only (virgin state). The values alpha(end) are not accessible by simple spectrophotometer measurements. (c) 2007 Elsevier B.V. All rights reserved.
机译:原始熔融石英(III型)样品中ArF激光脉冲的传输在入射通量H-in = 5 mJ cm(-2)脉冲(-1)的N = 10(6)脉冲期间发生变化。使用修正的比尔定律由脉冲能量吸收系数alpha(N,H-in)确定相关吸收,产生的初始值alpha(ini)在0.005cm(-1)左右,最大alpha(max)<= 0.02 cm (-1)在N = 10(3)-10(4)和固定值0.0045 cm(-1)<= alpha(end)<= 0.0094 cm(-1)后N近似于6 x 10(5)个脉冲。通过速率方程模型模拟显影α(N,H-in =常数),并假设脉冲数与P中心密度E'(N)有关。 E'(N)由E'中心生成和退火之间的动态平衡确定。单光子吸收时,前体ODC II和不稳定的SiH结构以光解方式产生,并通过双光子激发从应变的SiO键中产生。 E'与SiO2网络中存在的H-2的反应决定了在激光脉冲之间的暗周期内进行退火。仅在第一次样品辐照(原始状态)时观察到显影alpha(N,H-in = const。)。简单的分光光度计测量无法访问值alpha(end)。 (c)2007 Elsevier B.V.保留所有权利。

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