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首页> 外文期刊>Journal of Materials Chemistry, C. materials for optical and electronic devices >First-principles study of 3d transition metal atom adsorption onto graphene: the role of the extended line defect
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First-principles study of 3d transition metal atom adsorption onto graphene: the role of the extended line defect

机译:石墨烯上3d过渡金属原子吸附的第一性原理:延长线缺陷的作用

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摘要

A type of extended line defect (ELD) with two pentagons plus an octagon as the basic unit is currently an experimentally available topological defect in the graphene lattice, which brings about some interesting modifications to the electronic properties of graphene. Within the framework of density functional theory (DFT), we perform a systematic calculation to clarify the role of the ELD in 3d-transition metal atom (TMA) adsorption onto the graphene surface. We find that, in contrast to the ordinary lattice position of graphene, the ELD presents a much stronger adsorption for the TMAs(Sc-Cu). Thus, the presence of ELD provides a feasible approach to pattern magnetic impurities onto the graphene surface in a controllable and self-assembled way. In addition, our calculation indicates that as the adatom near the ELD alters from Sc to Cu, the spin moment and the adsorption energy show intricate variations. By means of symmetry analysis, we establish a hybridization picture between the TMA orbitals and the p(z) orbital of graphene, by which these numerical results are reasonably explained. Finally, by calculating the electronic transport properties based on the DFT and nonequilibrium Green function technique, we find that when the electron tunnels through an ELD with Co or Fe adsorption, the maximum spin-filter efficiency can reach 85% and 97%, respectively, with a bias voltage less than 0.6 V. Therefore, these composite structures of graphene with TMA adsorbed by the ELD can be considered as a prototype of a spin-filter device.
机译:具有两个五边形加一个八边形作为基本单元的延长线缺陷(ELD)类型目前是石墨烯晶格中实验可得的拓扑缺陷,它对石墨烯的电子性质进行了一些有趣的修饰。在密度泛函理论(DFT)的框架内,我们进行了系统的计算,以阐明ELD在3d过渡金属原子(TMA)吸附到石墨烯表面上的作用。我们发现,与石墨烯的普通晶格位置相反,ELD对TMAs(Sc-Cu)的吸附作用强得多。因此,ELD的存在提供了一种可行的方法,以可控和自组装的方式将磁性杂质图案化到石墨烯表面上。另外,我们的计算表明,随着ELD附近的吸附原子从Sc变为Cu,自旋矩和吸附能呈现出复杂的变化。通过对称分析,我们在TMA轨道和石墨烯的p(z)轨道之间建立了杂交图,从而合理地解释了这些数值结果。最后,通过基于DFT和非平衡Green函数技术计算电子传输特性,我们发现,当电子通过带有Co或Fe吸附的ELD隧穿时,最大自旋滤光效率分别可以达到85%和97%,具有小于0.6 V的偏置电压。因此,这些被ELD吸附的TMA石墨烯复合结构可以被认为是自旋滤波器的原型。

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