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首页> 外文期刊>Journal of Materials Chemistry, A. Materials for energy and sustainability >Titanium dioxide electron-selective interlayers created by chemical vapor deposition for inverted configuration organic solar cells
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Titanium dioxide electron-selective interlayers created by chemical vapor deposition for inverted configuration organic solar cells

机译:通过化学气相沉积产生的二氧化钛电子选择性中间层,用于反向配置的有机太阳能电池

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We demonstrate the use of chemical vapor deposition (CVD) to create unique thin (12-36 nm) and conformal TiO2 interlayers on indium-tin oxide (ITO) electrodes, for use as electron collection contacts in inverted bulk heterojunction P3HT/PC_(61)BM organic photovoltaics (OPVs). Optimized CVD formation of these oxide films is inherently scalable to large areas, and may be a viable non-contact alternative to electron-selective interlayer formation. Oxide-based electron-selective interlayers, such as TiO2, need to be thin, conformal and sufficiently electronically conducting films without sacrificing electron harvesting selectivity. Using volatile titanium-tetraisopropoxide (TTIP) precursors in a flowing N2 gas stream, the CVD process provides nanometer control of film thickness to produce 12-36 nm thickness device-quality films. The best performing CVD films, processed at substrate temperatures of ca. 210 °C, characterized using X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) were found to be amorphous but stoichiometric TiO2. Solution electrochemistries (voltammetry) of probe molecules were shown to be easily accessible indicators of film porosity and are predictive for electron harvesting selectivity (and hole-blocking) in an inverted configuration OPV platform. Small molecules whose redox potentials placed them energetically above the conduction band edge energy (E_(CB)) were reduced/ oxidized at nearly the same rates as for bare ITO.
机译:我们演示了使用化学气相沉积(CVD)在铟锡氧化物(ITO)电极上创建独特的薄(12-36 nm)和共形TiO2中间层,用作反向本体异质结P3HT / PC_(61)中的电子收集触点BM有机光伏(OPV)。这些氧化物膜的优化的CVD形成本质上可扩展到大面积,并且可能是电子选择性夹层形成的可行的非接触替代方法。诸如TiO2之类的基于氧化物的电子选择性中间层需要是薄的,保形的并且具有足够的电子导电膜,而不会牺牲电子收集的选择性。在流动的N2气流中使用挥发性四异丙氧基钛(TTIP)前驱体,CVD工艺可对膜厚进行纳米控制,以生产12-36 nm厚的器件级膜。性能最佳的CVD膜,在约200摄氏度的基材温度下处理。 210℃,使用X射线衍射(XRD)和X射线光电子能谱(XPS)表征,发现是无定形但化学计量的TiO2。探针分子的溶液电化学(伏安法)被证明是易于获得的膜孔隙度指标,并且在反向配置的OPV平台中可预测电子收集的选择性(和空穴阻挡)。小分子的氧化还原电势使其能量高于导带边缘能(E_(CB)),其还原/氧化速度几乎与裸ITO相同。

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