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Nanoscratch Simulation on a Copper Thin Film Using a Novel Multiscale Model

机译:新型多尺度模型在铜薄膜上的纳米划痕模拟

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A two-dimensional (2D) multiscale model to simulate the nanoscratching of a copper thin film is discussed in this paper. The multiscale model uses the classical molecular dynamics (MD) method to simulate the atomistic region, the strong-form meshless Hermite-Cloud method to simulate the continuum region, and a novel handshaking algorithm to couple them together. The dependence of the coefficient of friction on parameters such as the scratch speed, indentation depth, and lattice structure has been investigated. A new scheme is also proposed to translate the atomistic region during the simulation; it allows a constant atomistic region size to be maintained. By restricting the size of the atomic region, and by maintaining it to be constant through the use of an adaptive nodal distribution scheme, the multiscale model is able to provide an efficient solution to the nanoscratch problem, saving on computational resources.
机译:本文讨论了二维(2D)多尺度模型,用于模拟铜薄膜的纳米划痕。多尺度模型使用经典的分子动力学(MD)方法模拟原子区域,使用强形式的无网格Hermite-Cloud方法模拟连续区域,并使用新颖的握手算法将它们耦合在一起。已经研究了摩擦系数对诸如刮擦速度,压痕深度和晶格结构等参数的依赖性。还提出了一种在仿真过程中平移原子区域的新方案。它允许保持恒定的原子区域大小。通过限制原子区域的大小,并通过使用自适应节点分布方案使其保持恒定,多尺度模型能够为纳米划痕问题提供有效的解决方案,从而节省了计算资源。

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