Raman characterization of CdTe nanocrystaliites embedded in a glass matrix

摘要

The results of a Raman study of nanometre-size CdTe crystals are presented. The measurements are part of on-going studies on the structural and optical properties of CdTe clusters in glass [1-4]. Potter [1] characterized structurally the CdTe semiconductor-glass composites thin films using transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and X-ray diffraction. The absorption band edge and photoluminescence (PL) peak dependence on crystallite size and CdTe volume fractions have been studied by Potter et al. [3] and by Ochoa et al. [4], respectively. Good agreement in the crystallite size-dependence of the absorption edges between the measured values and the fully decoupled models is found when size broadening and electron/hole wavefunction prepara-tions are taken into account [3], Ochoa et al. [4] reported that the PL process in CdTe crystallites is not associated with surface-mediated radiative tran-sitions.