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首页> 外文期刊>Journal of Low Power Electronics >An Integrated Approach for Fine-Grained Power and Peak Temperature Management During High-Level Synthesis
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An Integrated Approach for Fine-Grained Power and Peak Temperature Management During High-Level Synthesis

机译:高层综合过程中细粒度功率和峰值温度管理的集成方法

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Power and temperature has become the major design challenges in the development of today's complex low power digital integrated circuits due to the adverse effect of these parameters on performance, reliability, cooling and packing costs, as well as increase in leakage power as we gradually move towards deep submicron technology. The increasing adoption of fine-grained power management strategies in design synthesis flow has motivated us to build power and temperature conscious designs using such design architectures at the behavioral level. The stringent power budget of fine grained power managed digital integrated circuits have driven chip designers to optimize power at the cost of area and delay. We study the design space defined due to this trade-off and present a branch-and-bound (B/B) algorithm to explore this state space and report the paretooptimal front with respect to area and power. We also explore the scope of parallelism within the branch-and bound (B/B) algorithm for control and data-flow intensive circuits in order to address the scalability issue. In this paper, we propose power and temperature aware multi-objective scheduling and binding algorithms during behavioral synthesis stage using fine-grained dynamic voltage scaling enabled functional units to alleviate the problem of localized heating, which often leads to hotspot zones in chips.
机译:由于这些参数对性能,可靠性,冷却和封装成本的不利影响,以及随着我们逐渐向着低功耗发展,泄漏功率的增加,功率和温度已成为当今复杂的低功率数字集成电路开发中的主要设计挑战。深亚微米技术。在设计综合流程中越来越多地采用细粒度的电源管理策略,这促使我们在行为水平上使用此类设计架构来构建对功耗和温度敏感的设计。细粒度功率管理数字集成电路的严格功率预算驱使芯片设计人员以面积和延迟为代价来优化功率。我们研究了由于这种折衷而定义的设计空间,并提出了一种分支定界(B / B)算法来探索此状态空间并报告关于面积和功率的次优前沿。我们还研究了控制和数据流密集型电路的分支定界(B / B)算法中并行性的范围,以解决可伸缩性问题。在本文中,我们提出了在行为综合阶段使用功耗和温度感知的多目标调度和绑定算法,该算法使用细粒度动态电压缩放启用功能单元来缓解局部加热的问题,该问题经常导致芯片中出现热点区域。

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