The microstructural characterization of in situ grown Si3N4 whisker-reinforced barium aluminum silicate ceramic matrix composite

摘要

The microstructure of Barium AluminumSilicate(BAS) / Silicon Nitride in situ whisker reinforcedceramic matrix composite was examined by X-ray diffraction,transmission electron microscopy, electron diffraction andenergy-dispersive X-ray microanalysis. Although we cannotconclusively exclude the presence of orthorhombic BAS,hexagonal BAS and both α-Si3N4 and β-Si3N4 wereidentified in this material. The crystallization process of theglass phase can be taken almost to completion but a smallproportion of residual glass phase is present. Both whiskerlikeand equiaxed β-Si3N4 exist in this material.