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Microhardness of the YbAgxIn1-xCu4 system

机译:YbAgxIn1-xCu4系统的显微硬度

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We report Vickers microhardness measurements on flux grown single crystals of the YbAg(x)ln(1-x)Cu(4) alloy system. Although sample dependent, the microhardness exhibits a clear concentration dependence: in general, it decreases with x. The lattice parameter as a function of x exhibits a similar behavior. For x < 0.5, where the lattice parameter is almost constant, the microhardness exhibits a weak enhancement. Similar concentration dependence of the lattice parameter, resistivity and microhardness allows us to conclude that the microhardness reflects the evolution of the YbAg(x)ln(1-x)Cu(4) alloy system towards more metallic character with increasing x. (c) 2005 Springer Science + Business Media, Inc.
机译:我们报告了YbAg(x)ln(1-x)Cu(4)合金系统的助熔剂生长的单晶的维氏显微硬度测量。尽管取决于样品,但显微硬度表现出明显的浓度依赖性:通常,它随x降低。作为x的函数的晶格参数表现出相似的行为。对于x <0.5,晶格参数几乎恒定,显微硬度显示出较弱的增强。晶格参数,电阻率和显微硬度的类似浓度依赖性使我们得出结论,显微硬度反映了YbAg(x)ln(1-x)Cu(4)合金体系随着x的增加而向更多金属特性的演变。 (c)2005年Springer Science + Business Media,Inc.

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