...
首页> 外文期刊>Journal of instrumentation: an IOP and SISSA journal >PIXIE III: a very large area photon-counting CMOS pixel ASIC for sharp X-ray spectral imaging
【24h】

PIXIE III: a very large area photon-counting CMOS pixel ASIC for sharp X-ray spectral imaging

机译:PIXIE III:用于清晰的X射线光谱成像的超大面积光子计数CMOS像素ASIC

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

PIXIE III is the third generation of very large area (32×25 mm~2) pixel ASICs developed by Pixirad Imaging Counters s.r.l. to be used in combination with suitable X-ray sensor materials (Silicon, CdTe, GaAs) in hybrid assemblies using flip-chip bonding. A Pixirad unit module based on PIXIE III shows several advances compared to what has been available up to now. It has a very broad energy range (from 2 to 100 keV before full pulse saturation), high speed (100 ns peaking time), high frame rate (larger than 500 fps), dead-time-free operation, good energy resolution (around 2 keV at 20 keV), high photo-peak fraction and sharp spectral separation between the color images. In this paper the results obtained with PIXIE III both in a test bench set-up as well in X-ray imaging applications are discussed.
机译:PIXIE III是由Pixirad Imaging Counters s.r.l开发的第三代超大面积(32×25 mm〜2)像素ASIC。可通过倒装芯片键合与混合组件中的合适X射线传感器材料(硅,CdTe,GaAs)结合使用。与目前可用的模块相比,基于PIXIE III的Pixirad单元模块显示出一些进步。它具有非常宽的能量范围(完全脉冲饱和前为2到100 keV),高速(峰值时间为100 ns),高帧速率(大于500 fps),无死角时间运行,良好的能量分辨率(大约在20 keV时为2 keV),较高的光峰分数和彩色图像之间的清晰光谱分离。在本文中,讨论了在试验台设置以及X射线成像应用中使用PIXIE III获得的结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号