Front-end electronics for Micro Pattern Gas Detectors with integrated input protection against discharges

摘要

One of the major problems that have to be addressed in the design of the frontend electronics for readout of MPGDs, is its resistance to possible random discharges inside active detector volume. This issue becomes particularly critical for the electronics built as ASICs implemented in a modern CMOS technology, for which the breakdown voltages are in the range of a few Volts, while the discharges may result in voltage spikes of even thousands Volts. The paper presents test results of input protection structures integrated with a specific design of the front-end electronics manufactured in the 350 nm CMOS process. The structures were tested using an electrical circuit to mimic discharges in the detectors for different voltage and current parameters of the sparks. Accomplished measurements showed no degradation in the front-end electronics performance even after very excessive discharge tests.