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首页> 外文期刊>Journal of instrumentation: an IOP and SISSA journal >An hybrid detector GEM-ASIC for 2-D soft X-ray imaging for laser produced plasma and pulsed sources
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An hybrid detector GEM-ASIC for 2-D soft X-ray imaging for laser produced plasma and pulsed sources

机译:用于激光产生的等离子体和脉冲源的二维软X射线成像的混合探测器GEM-ASIC

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The following paper presents a new 2-D detector (‘GEMpix’) in the soft X-ray range, having a wide dynamic range thanks to its intrisic gain, working in charge integration mode to be used for diagnosing laser produced plasma (LPP) or X-ray pulsed sources. It is a gas detector based on the Gas Electron Multiplier (GEM) technology with a quad-medipix chip as read-out electronics. In our prototype, the substitution of semiconductor material with a gas triple-GEM allows several advantages with respect to the detectors commonly used in LPP, as X-ray CCDs and Micro Channel Plates or Image Plates. In these experiments the configuration Time-over-Threshold (ToT) has been used, to measure the total charge released to the gas and collected by each pixel, integrated over the X-ray burst duration. Intensity response and spatial resolution has been measured first in laboratory for calibration, as function of the voltage applied to the GEMs, in single photon regime with energies between 3.7 and 17 keV. Subsequently it has been tested at the ABC laser facility (ENEA, Frascati). In this case, we measured the X-rays produced when the ABC neodymium laser, with pulse of 50 J and 3 ns time width, hits plane targets of aluminum. 2-D images have been acquired by means of a pinhole configuration with magnification 1.5 and 50 μm of spatial resolution. The results are encouraging regarding the capability of this imaging detector to work in experiments where soft X-ray emissivity varies over many orders of magnitude.
机译:以下论文介绍了一种新型的二维X检测器('GEMpix'),它在软X射线范围内,由于其固有的增益而具有较宽的动态范围,并在电荷积分模式下工作,可用于诊断激光产生的等离子体(LPP)或X射线脉冲源。它是一种基于气体电子倍增器(GEM)技术的气体检测仪,带有一个四通道medipix芯片作为读出电子设备。在我们的原型中,用气体三重GEM代替半导体材料相对于LPP中常用的检测器(如X射线CCD和微通道板或成像板)具有多个优点。在这些实验中,已使用时间阈值(ToT)配置来测量释放到气体中并由每个像素收集的总电荷,这些电荷在X射线猝发持续时间内进行了积分。强度响应和空间分辨率首先在实验室中进行了测量,作为能量施加在GEM上的函数的函数,在能量为3.7至17 keV的单光子条件下进行了校准。随后,它已在ABC激光设备(ENEA,弗拉斯卡蒂)进行了测试。在这种情况下,我们测量了当ABC钕激光器以50 J的脉冲和3 ns的时间宽度入射到铝的平面目标时产生的X射线。借助针孔配置可获取二维图像,该针孔配置的放大倍数为1.5,空间分辨率为50μm。关于这种成像检测器在软X射线发射率变化多个数量级的实验中工作的能力,结果令人鼓舞。

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