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Formation behavior and interfaces of TiB in-situ formed in CP Ti matrix

机译:CP Ti基体中原位形成TiB的形成行为和界面

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摘要

Formation behavior and characteristics of theinterface which were in-situ formed between TiB2 reactant powderand a-Ti matrix were investigated. Furthermore, the effect of a TiBgrowth on densification of Ti/TiB2 mixture was also examined.Mixed powders of TiB2 or B4C powder with CP Ti powders werecompacted and pre-sintered at 700℃ for 1 hr followed bysintering at 900, 1000, 1100, 1200, 1300℃ for 3hrs, respectively.In addition, another specimens were sintered at 1000℃ forvarious times in order to study the formation behavior of TiBreinforcement in-situ formed in the α-Ti matrix. TiB was formedthrough the different mechanisms - formation of fine TiB andformation of coarse TiB by Ostwald ripening or coalescence offine TiB. There was no crystallographic relationship between TiBand matrix. There were voids at the interface between TiBreinforcement and α-Ti matrix because of the preferential growthof TiB without any crystallographic relationship with α-Ti matrixand the surface energy between Ti matrix and TiB reinforcements,and so densification of Ti/TiB2 compacts was hindered by the coarse TiB growth.
机译:研究了TiB2反应物粉末与a-Ti基体之间原位形成的界面行为和特征。此外,还研究了TiB生长对Ti / TiB2混合物致密化的影响。将TiB2或B4C粉末与CP Ti粉末的混合粉末压实并在700℃下预烧结1小时,然后在900、1000、1100、1200下烧结分别在1300℃和1300℃下烧结3个小时。另外,在1000℃下烧结另一次试样,以研究在α-Ti基体中原位形成的TiB增强材料的形成行为。 TiB是通过不同的机理形成的-细TiB的形成和粗TiB的奥斯特瓦尔德熟化或细TiB的聚结形成。 TiBand基质之间没有晶体学关系。由于TiB优先生长而与α-Ti基体没有任何晶体学关系,且Ti基体与TiB增强体之间的表面能,因此TiB增强体与α-Ti基体之间的界面处存在空隙,因此,Ti / TiB2压坯的致密化受到阻碍TiB粗大生长。

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