NEXAFS/XPS spectra, and information depth using low energy electron spectromicroscopy in a VPPEM

摘要

The first spectroscopic results from a vector potential photoelectron microscope (VPPEM) show that unique information can be extracted from VPPEM images and spectra. Very low energy electrons (<1.0 eV) are optimum for imaging in a VPPEM, but the binding energy of the XPS signal is only separated from the NEXAFS peak by the work function. This makes the VPPEM spectra more complex to interpret, although providing additional information. VPPEM images show considerable spectral contrast, and these results show that the spectra can be tuned to give estimates of the information depth using the XPS signal.