...
首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part B. Solid State Phenomena >Theoretical Study of the Atomic and Electronic Structure of Grain Boundaries in SiC
【24h】

Theoretical Study of the Atomic and Electronic Structure of Grain Boundaries in SiC

机译:SiC中晶界的原子和电子结构的理论研究

获取原文
获取原文并翻译 | 示例
           

摘要

The atomic and electronic structure of a typical coincidence tilt boundary in cubic SiC, the {122}∑=9 boundary, has been examined theoretically using the first-principles calculations based on the density-functional theory. Results are compared with recent electron microscopy observations. We have obtained the stable configurations for the N-type polar, P-type polar and non-polar interfaces, which have different interface stoichiometries and different numbers of Si-Si or 0-0 wrong bonds. The relative stability among the interfaces has been analyzed by calculating the thermodynamic potentials as a function of the atomic chemical potentials. The relative stability of the zigzag model against the straight model for the non-polar interface has been shown, which can well explain the high-resolution electron microscopy observation of the triple junction of the ∑=9 and ∑=3 boundaries. Effects of wrong bonds on the electronic structure have been analyzed through the electronic structures of the interfaces and antisite defects, which are consistent with electron energy-loss spectroscopy observations.
机译:理论上已经使用基于密度泛函理论的第一原理计算方法对立方SiC中典型的重合倾斜边界{122} ∑ = 9边界的原子和电子结构进行了研究。将结果与最近的电子显微镜观察结果进行比较。我们已经获得了N型极性,P型极性和非极性界面的稳定构型,它们具有不同的界面化学计量和不同数量的Si-Si或0-0错误键。通过计算热力学势与原子化学势的函数,分析了界面之间的相对稳定性。已经显示了锯齿形模型相对于非极性界面的直线模型的相对稳定性,可以很好地解释∑ = 9和∑ = 3边界的三重结的高分辨率电子显微镜观察。通过界面的电子结构和反位缺陷分析了错误键对电子结构的影响,这与电子能量损失谱的观察结果一致。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号