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The influence of quantum size effects on magnetic properties of thin-film systems

机译:量子尺寸效应对薄膜系统磁性能的影响

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Results on the investigation of magnetic and magneto-optical properties of Fe/NML/Fe (NML: Mo, Ta) thin-film systems are presented. The examined samples were prepared by DC magnetron sputtering technique. The hysteresis loops and spectral dependencies of the transverse Kerr effect (TKE) were measured employing the magneto-optical magnetometer and the magnetooptical spectrometer, respectively. The saturation field of the examined trilayers was revealed to oscillate as a function of the NML layer thickness, and the period of these oscillations to depend on the Fe layer thickness. The TKE spectra of the studied systems were found to be identical but the TKE values depend on the thickness of both Fe and Mo, Ta layers.
机译:提出了研究Fe / NML / Fe(NML:Mo,Ta)薄膜系统的磁和磁光性能的结果。通过DC磁控溅射技术制备检查的样品。分别使用磁光磁力计和磁光光谱仪测量了横向克尔效应(TKE)的磁滞回线和光谱相关性。揭示了所检查的三层的饱和场随NML层厚度的变化而振荡,并且这些振荡的周期取决于Fe层的厚度。发现所研究系统的TKE光谱相同,但TKE值取决于Fe和Mo,Ta层的厚度。

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