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首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part A. Defect and Diffusion Forum >EBIC/XPS Study of Antimony Equilibrium Segregation at the Germanium Surface
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EBIC/XPS Study of Antimony Equilibrium Segregation at the Germanium Surface

机译:EBIC / XPS研究锗表面的锑平衡偏析

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The equilibrium segregation of antimony at Ge surface was investigated using X-ray Photoelectron Spectroscopy (XPS) and Electron Beam Induced Current (EBIC) techniques. XPS spectra showed a progressive shift of the germanium lines towards the high binding energies as the duration of the segregation treatment increases. The shift was related to the band bending in the surface region resulting from a high density of surface states. EBIC observations revealed islands of bright contrast covering few micron distance below the surface. The contrast was related to the increase of the depletion region width of the Schottky contact as a result of the dopant segregation.
机译:用X射线光电子能谱(XPS)和电子束感应电流(EBIC)技术研究了锑在锗表面的平衡偏析。 XPS光谱显示,随着分离处理时间的延长,锗线逐渐向高结合能移动。该变化与由于高表面状态密度导致的表面区域中的带弯曲有关。 EBIC观察发现,明亮的对比岛覆盖了表面以下几微米的距离。对比度与由于掺杂剂偏析导致的肖特基接触的耗尽区宽度的增加有关。

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