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Thermal correction to resistivity in dilute Si-MOSFET two-dimensional systems

机译:在稀Si-MOSFET二维系统中对电阻率进行热校正

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摘要

Neglecting electron-electron interactions and quantum interference effects, we calculate the classical resistivity of a two-dimensional electron (hole) gas, taking into account the degeneracy and the thermal correction due to the combined Peltier and Seebeck effects. The resistivity is found to be a universal function of the temperature, expressed in units of (h/e(2))(k(F)l)(-1). Analysis of the compressibility and thermopower points to the thermodynamic nature of the metal-insulator transition in two-dimensional systems. We reproduce the beating pattern of Shubnikov-de Haas oscillations in both the crossed field configuration and Si-MOSFET valley splitting cases. The consequences of the integer quantum Hall effect in a dilute Si-MOSFET two-dimensional electron gas are discussed. The giant parallel magnetoresistivity is argued to result from the magnetic-field-driven disorder. (C) 2005 Pleiades Publishing, Inc.
机译:忽略电子-电子相互作用和量子干扰效应,我们考虑了归因于珀尔帖效应和塞贝克效应的简并和热校正,计算了二维电子(空穴)气体的经典电阻率。发现电阻率是温度的通用函数,以(h / e(2))(k(F)1)(-1)为单位表示。对可压缩性和热功率的分析指出了二维系统中金属-绝缘体转变的热力学性质。我们在交叉场配置和Si-MOSFET谷值分裂情况下都再现了Shubnikov-de Haas振荡的跳动模式。讨论了在稀释的Si-MOSFET二维电子气中整数量子霍尔效应的后果。巨大的平行磁阻被认为是由磁场驱动的紊乱引起的。 (C)2005年Pleiades Publishing,Inc.

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