Double resonant Raman scattering in nanographite films

摘要

Experimental results are presented on Raman scattering in graphite films produced by DC plasmaenhanced chemical vapor deposition from a methane-hydrogen gas mixture. Scanning electron and probe microscopy data show that, depending on substrate material and deposition time, the deposited film is either a mesoporous material consisting of graphite nanocrystallites with basal planes oriented perpendicular to the substrate surface or an atomically flat, nanometer-thick stack of graphene layers parallel to the substrate. A comparative Raman spectroscopy analysis is performed for film samples deposited on nickel and silicon substrates for 5 and 60 min, as well as for highly ordered graphite samples. The Raman spectra of the examined samples correspond to the double resonant scattering mechanism. The behavior of Raman peak position and intensity as functions of excitation wavelength suggests a high degree of structural order in the graphite films deposited on nickel for 5 min. The results obtained are used to show that the thickness of these films is 1.5 +/- 0.5 nm.