Applications of digital speckle correlation to microscopic strain measurement and materials' property characterization

摘要

The method of digital speckle correlation is introduced, and so is the hardware system to implementthe method. The advantages and the features of the technique are discussed, and applicationexamples are given. Owing to the high spatial resolution that this technique can achieve, the method isespecially useful in measuring small areas of an object, or a small component in an assembly,whether the surfaces under probing are planar or not. The applications have proved that the techniqueis a promising tool for the reliability study of microelectronic packages.