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首页> 外文期刊>Journal of Electronic Materials >Large-Area Oxidation of AlAs Layers for Dielectric Stacks and Thick Buried Oxides
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Large-Area Oxidation of AlAs Layers for Dielectric Stacks and Thick Buried Oxides

机译:介电堆栈和厚埋氧化物的AlAs层的大面积氧化

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摘要

The wet oxidation of AlAs and AlGaAs has been limited to relatively small lateral dimensions and relatively thin layers.Approaches are described to extend the oxide dimensions both horizontally and vertically,creating large-area and thick buried oxides.Two types of large-area structures are examined:dielectric stacks with thin buried oxides and semiconductor-on-insulator structures with thick buried oxides.Low Al-content AlGaAs layers with low oxidation rates are used as the high-index layers in large-area dielectric-stack structures.High Al-content AlGaAs layers with low volume contraction are used to create stable,thick buried oxides with millimeter-scale areas.
机译:AlAs和AlGaAs的湿法氧化仅限于较小的横向尺寸和相对薄的层。描述了在水平和垂直方向上扩展氧化物尺寸的方法,从而形成了大面积和厚埋掩埋氧化物。两种类型的大面积结构是检验:具有薄埋氧化物的电介质堆叠和具有厚埋氧化物的绝缘体上半导体结构。低氧化率的低Al含量AlGaAs层被用作大面积电介质堆叠结构的高折射率层。体积收缩率低的AlGaAs层可用于生成稳定,厚度为毫米级的厚掩埋氧化物。

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