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Cathodoluminescence and Field-Emission Properties of β-Ga_2O_3 Nanobelts

机译:β-Ga_2O_3纳米带的阴极发光和场致发射特性

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β-Ga_2O_3 nanobelts were synthesized using a vapor transport process in a controlled ambient. Structural characterization revealed that the as-synthesized samples consisted of monoclinic β-Ga_2O_3 nanobelts, and the presence of gallium-associated defects was verified using cathodoluminescence (CL). The formation of gallium-associated defects was explained by the insufficiency of the supply of cations, generating gallium vacancies on the (010) facet during growth. Furthermore, field-emission measurements indicated that β-Ga_2O_3 nanobelts exhibited defect-related electron emission. The turn-on fields of β-Ga_2O_3 nanobelts increased significantly with the degree of structural defects. For a sample prepared under 15% ambient oxygen, Fowler-Nordheim (F-N) analysis revealed two distinct field-enhancement factors of 1194 and 276, respectively. A correlation between field emission and structural defects was proposed. The experimental results demonstrate the presence of gallium-associated defects, which behave as electron traps, degrading the electron field-emission properties of β-Ga_2O_3 nanobelts.
机译:β-Ga_2O_3纳米带是在受控环境下利用气相传输过程合成的。结构表征表明,合成后的样品由单斜晶β-Ga_2O_3纳米带组成,并且使用阴极发光(CL)验证了镓相关缺陷的存在。镓相关缺陷的形成是由于阳离子供应不足,在生长过程中(010)面上产生了镓空位。此外,场发射测量表明β-Ga_2O_3纳米带表现出与缺陷相关的电子发射。 β-Ga_2O_3纳米带的开启场随结构缺陷的程度而显着增加。对于在15%的环境氧下制备的样品,Fowler-Nordheim(F-N)分析显示两个不同的场增强因子,分别为1194和276。提出了场发射与结构缺陷之间的关系。实验结果表明存在与镓有关的缺陷,这些缺陷表现为电子陷阱,从而降低了β-Ga_2O_3纳米带的电子场发射特性。

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