首页> 外文期刊>Journal of Electronic Materials >Effect of Pd Thickness on the Interfacial Reaction and Shear Strength in Solder Joints Between Sn-3.0Ag-0.5Cu Solder and Electroless Nickel/Electroless Palladium/Immersion Gold (ENEPIG) Surface Finish
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Effect of Pd Thickness on the Interfacial Reaction and Shear Strength in Solder Joints Between Sn-3.0Ag-0.5Cu Solder and Electroless Nickel/Electroless Palladium/Immersion Gold (ENEPIG) Surface Finish

机译:Pd厚度对Sn-3.0Ag-0.5Cu焊料与化学镍/化学钯/浸金(ENEPIG)表面处理之间的界面反应和焊缝剪切强度的影响

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摘要

Intermetallic compound formation at the interface between Sn-3.0Ag-0.5Cu (SAC) solders and electroless nickel/electroless palladium/immersion gold (ENEPIG) surface finish and the mechanical strength of the solder joints were investigated at various Pd thicknesses (0 (mu)m to 0.5 (mu)m). The solder joints were fabricated on the ENEPIG surface finish with SAC solder via reflow soldering under various conditions. The (Cu,Ni)_(6)Sn_(5) phase formed at the SAC/ENEPIG interface after reflow in all samples. When samples were reflowed at 260 deg C for 5 s, only (Cu,Ni)_(6)Sn_(5) was observed at the solder interfaces in samples with Pd thicknesses of 0.05 (mu)m or less. However, the (Pd,Ni)Sn_(4) phase formed on (Cu,Ni)_(6)Sn_(5) when the Pd thickness increased to 0.1 (mu)m or greater. A thick and continuous (Pd,Ni)Sn_(4) layer formed over the (Cu,Ni)_(6)Sn_(5) layer, especially when the Pd thickness was 0.3 (mu)m or greater. High-speed ball shear test results showed that the interfacial strengths of the SAC/ENEPIG solder joints decreased under high strain rate due to weak interfacial fracture between (Pd,Ni)Sn_(4) and (Cu,Ni)_(6)Sn_(5) interfaces when the Pd thickness was greater than 0.3 (mu)m. In the samples reflowed at 260 deg C for 20 s, only (Cu,Ni)_(6)Sn_(5) formed at the solder interfaces and the (Pd,Ni)Sn_(4) phase was not observed in the solder interfaces, regardless of Pd thickness. The shear strength of the SAC/ENIG solder joints was the lowest of the joints, and the mechanical strength of the SAC/ENEPIG solder joints was enhanced as the Pd thickness increased to 0.1 (mu)m and maintained a nearly constant value when the Pd thickness was greater than 0.1 (mu)m. No adverse effect on the shear strength values was observed due to the interfacial fracture between (Pd,Ni)Sn_(4) and (Cu,Ni)_(6)Sn_(5) since the (Pd,Ni)Sn_(4) phase was already separated from the (Cu,Ni)_(6)Sn_(5) interface. These results indicate that the interfacial microstructures and mechanical strength of solder joints strongly depend on the Pd thickness and reflow conditions.
机译:研究了Sn-3.0Ag-0.5Cu(SAC)焊料与化学镍/化学钯/浸金(ENEPIG)表面光洁度之间界面处的金属间化合物的形成以及在各种Pd厚度(0(μ m至0.5μm)。焊点是在各种条件下通过回流焊接在SAEP焊料的ENEPIG表面上制成的。在所有样品中回流后,在SAC / ENEPIG界面形成的(Cu,Ni)_(6)Sn_(5)相。当样品在260℃回流5 s时,在Pd厚度小于或等于0.05μm的样品中,仅在焊料界面处观察到(Cu,Ni)_(6)Sn_(5)。但是,当Pd的厚度增加到0.1μm以上时,在(Cu,Ni)_(6)Sn_(5)上形成(Pd,Ni)Sn_(4)相。在(Cu,Ni)_(6)Sn_(5)层上形成厚且连续的(Pd,Ni)Sn_(4)层,特别是当Pd厚度为0.3μm以上时。高速球剪切试验结果表明,由于(Pd,Ni)Sn_(4)和(Cu,Ni)_(6)Sn_之间的界面断裂较弱,SAC / ENEPIG焊点的界面强度在高应变速率下降低了(5)当Pd厚度大于0.3μm时界面。在260℃回流20 s的样品中,仅在焊料界面形成(Cu,Ni)_(6)Sn_(5),在焊料界面未观察到(Pd,Ni)Sn_(4)相。 ,无论Pd厚度如何。 SAC / ENIG焊点的剪切强度是最低的,并且当Pd厚度增加到0.1μm时,SAC / ENEPIG焊点的机械强度提高,并且当Pd保持接近恒定值时,厚度大于0.1μm。由于(Pd,Ni)Sn_(4)自(Pd,Ni)Sn_(4)和(Cu,Ni)_(6)Sn_(5)之间的界面断裂,未观察到对剪切强度值的不利影响。相已经与(Cu,Ni)_(6)Sn_(5)界面​​分离。这些结果表明,焊点的界面微观结构和机械强度在很大程度上取决于Pd的厚度和回流条件。

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